METHOD FOR MEASURING PARAMETERS OF MATERIAL SURFACE UNDULATION AND DEVICE FOR MEASURING PARAMETERS OF PART SURFACE UNDULATION Russian patent published in 2022 - IPC G01B11/30 

FIELD: measuring equipment.

SUBSTANCE: proposed method and device relate to the field of equipment for measuring nano- and microroughness, regular relief (texture) of the surface, adhesion of coatings, tribotechnical characteristics and mechanical properties of functional surface material. The device for measuring parameters of part surface undulation contains a slipway for fixing and linear moving a part, fixed on separate racks with tripods, a laser radiation source, a semi-transparent screen, a camera with a lens, as well as a unit for controlling and processing measurements, while the laser radiation source and the semi-transparent screen with the video camera fixed to its back side are located at a distance of 100-400 mm from the part surface with the possibility of adjusting their operation position in such a way that a laser beam directed from the source at an angle of 5-20° to the measured part surface after the reflection is directed to the center of the screen, wherein there is an accelerometer on the movable part of the device.

EFFECT: increase in the efficiency of the technology for obtaining information on the surface topography, as well as expansion of the possibility of determining the profile directly on process installations for surface processing.

5 cl, 5 dwg