FIELD: instrumentation.
SUBSTANCE: invention relates to optical instrumentation and pertains to a method for determining the "fast" axis of a quarter-wave plate. The method includes passing linearly polarised emission at the working wavelength of the plate through the analysed quarter-wave plate, recording the transmitted emission by means of a photoelectric converter, and determining the "fast" axis of the plate from the polarity of the electrical signal generated by the photoelectric converter. The linearly polarised emission is normally incident on the analysed quarter-wave plate, wherein the emission polarisation plane coincides with the bisector of the angle between the "fast" and "slow" optical axes of the plate. The passed emission has circular polarisation, and the photoelectric converter has the property of generating, when impacted by circularly polarised emission, an electric signal, the polarity whereof depends on the direction of rotation of the electric field vector in the recorded emission.
EFFECT: structural simplification of the measuring apparatus.
1 cl, 2 dwg
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Authors
Dates
2022-06-29—Published
2021-04-30—Filed