FIELD: measuring.
SUBSTANCE: invention relates to the technology for measurement at ultrahigh frequencies (UHF) and can be used to determine the wave scattering parameters (S-parameters) of objects using a vector circuit analyser in non-standard transmission lines and in free space. According to the invention, when measuring using a vector circuit analyser, the vector circuit analyser is calibrated in a standard transmission line to obtain a 12-component model of an error adapter in a standard transmission line accounting for the switching terms; then an LR calibration procedure is conducted to obtain an 8-component model of an error adapter in a non-standard transmission line, followed by a procedure of recalculating the 8-component model in a non-standard transmission line and the 12-component model in a standard transmission line for a complex 12-component model describing transitions (or an error adapter) in a non-standard transmission line; then the parameters of the cascade connection of the tested apparatus and the circuits attributed to the resulting complex 12-component model of transitions (or error adapter) are measured, and a procedure of mathematical exclusion of the error adapter described by the complex 12-component model is performed in order to recalculate the measurement results for the physical boundaries of the tested apparatus and calculate the S-parameters thereof.
EFFECT: higher accuracy and repeatability of the measurement results.
1 cl, 5 dwg
