FIELD: X-ray spectral analysis.
SUBSTANCE: invention relates to in-line X-ray spectral analysis of ore and charge. The substance of the invention lies in the fact that the ore or charge moving on the conveyor belt passes under the analyzer, which creates X-ray radiation by the excitation unit in the analyzer, causing the secondary characteristic radiation reflected from the ore or charge, containing information on the mass fraction of chemical elements in the ore or charge , which is recorded by the spectrometric unit, which is part of the analyzer, while at the set time points tk, simultaneously with measurements of the secondary characteristic radiation Ik, measurements of the distances from the analyzer to the ore or charge Dk are carried out, which makes it possible to reject measurements of the secondary characteristic radiation Ik, aggravated by errors in the uneven placement of the analyzed material on the conveyor belt, using the modulus of the difference between the measured distance Dk and the base distance D from the analyzer to the average level of the analyzed material on the conveyor belt, which is compared with the threshold deviation m d from the middle level to the upper and lower levels, where D and d are the parameters determined before the start of measurements with the possibility of obtaining an estimate of the mass fraction of chemical elements in the composition of the ore or charge from the selected measurement values of the secondary characteristic radiation Ik.
EFFECT: increasing the accuracy of determining the mass fraction of chemical elements in the analyzed material in a non-contact in-line mode.
4 cl, 5 dwg
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Authors
Dates
2022-11-08—Published
2022-03-25—Filed