FIELD: physics.
SUBSTANCE: invention employs an energy-dispersive spectrometre with a semiconductor detector and a source of primary X-ray or gamma-radiation, lying directly over the conveyor belt with the analysed material, for measuring X-ray fluorescence spectra of the analysed material. The minimum mass of the representative sample of the selected element of the granular or lump material is measured, where the said sample is collected from the surface of the conveyor belt. The mass of the portion of material taking part in analysis and X-ray fluorescence intensity of the selected element are calculated. Geometric parametres of measurements, intensity and energy of the primary radiation, as well as the speed of the conveyor belt are varied in the calculations. From several alternatives obtained during calculation, the selected alternative is the one for which the mass of the portion of material taking part in analysis is greater than the minimum mass of the representative sample, the distance between the spectrometre and the material is not less than the anti-damage distance, intensity of analytical lines is maximum, and the fluctuation of distance between the spectrometre and the material has the least possible effect on intensity of analytical lines and the area of the region of the material taking part in analysis. The selected geometric parametres of measurements are then installed on the spectrometre and materials transported on the conveyor belt are then analysed.
EFFECT: high reliability of the obtained analytical information and efficiency of continuous energy-dispersive X-ray fluorescence on-stream analysis.
2 tbl, 4 dwg
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Authors
Dates
2011-05-20—Published
2010-04-23—Filed