FIELD: X-ray analysis.
SUBSTANCE: invention relates to X-ray phase analysis of ash and/or soil-containing samples. The substance of the invention lies in the fact that the diffraction pattern of the ash and/or soil-containing sample is registered, while before the registration of the diffraction pattern, the sample is prepared, while from the ash and/or soil samples to be analyzed, a set of particles with a diameter of less than 1 mcm is isolated with the release of magnetic particles from it. particles or without isolating the latter, and take as a sample for analysis a mass that ensures the formation of a layer of particles, characterized by the ratio of the intensity I of the beam passing through the layer to the intensity I0 of the beam incident on the layer, equal to I/I0=1000 or more, as well as the absence the background, which distorts the diffraction pattern due to the small thickness of the layer, and its area, which prevents the beam from going beyond its limits during the registration of the diffraction pattern.
EFFECT: increasing the sensitivity of X-ray phase analysis in relation to the totality of fine mineral and organic particles characteristic of the absorbing soil complex.
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Authors
Dates
2022-11-08—Published
2022-03-11—Filed