FIELD: measuring technology.
SUBSTANCE: invention is intended for non-destructive quality control of magnetic films and the study of their high-frequency characteristics by recording the spectral density of noise amplitude of the samples. The device contains a parallel oscillatory circuit, including capacitance and inductance, which is used as an unbalanced strip line. A sample of a thin magnetic film under study is placed inside the line, and the line itself, together with the sample, is placed inside a magnetic system that forms a constant magnetic field. The parallel oscillatory circuit is connected through a capacitor to a microwave generator and directly to an amplitude detector loaded at the input of a low-frequency spectrum analyser.
EFFECT: enabling the possibility of measuring magnetic noise in the microwave range.
1 cl, 4 dwg
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Authors
Dates
2023-04-04—Published
2022-12-21—Filed