DEVICE FOR MEASURING PARAMETERS OF THIN MAGNETIC FILMS BY METHOD OF FERROMAGNETIC RESONANCE AT RADIO FREQUENCIES Russian patent published in 2021 - IPC G01R33/05 

FIELD: physics.

SUBSTANCE: invention is used for measuring the parameters of thin magnetic films by the method of ferromagnetic resonance at radio frequencies. The essence of the invention lies in the fact that the device for measuring the parameters of thin magnetic films by the method of ferromagnetic resonance at radio frequencies has an RF generator, measuring coils that are part of the resonant circuit of the RF generator, Helmholtz rings, forming a constant magnetic field, while the device additionally contains a control unit and digital signal processing, which, by means of the drives, can independently rotate the stage with the test sample of a thin magnetic film and the measuring coil, and can also change the feedback coefficient of the RF generator operating in the autodyne mode.

EFFECT: invention is aimed at increasing the sensitivity of the device, ensuring the possibility of accurate angular adjustment of the position of both the test sample of a thin magnetic film and the Helmholtz measuring rings.

1 cl, 6 dwg