METHOD OF MEASURING DENSITY OF DARK EXCITONS IN SEMICONDUCTOR SYSTEMS OF EXCITON POLARITONS Russian patent published in 2024 - IPC G01N21/63 

FIELD: measurement.

SUBSTANCE: invention relates to measurement, namely to determination of density of dark excitons in semiconductor systems of exciton polaritons. Method for determining the density of dark excitons involves determining the density of a non-radiating and incoherent exciton reservoir from the independently experimentally measured blue shift of the photoluminescence line of a polariton Bose condensate and angle of inclination of law of dispersion of elementary excitations of this condensate, wherein exciton-polariton system is excited non-resonantly by constant or pulsed laser pumping, wherein the dependence of the speed of sound in the polariton liquid is mapped, which is determined by the angle of inclination of the dispersion law, from the blue shift of the photoluminescence line at given experimental parameters of the system.

EFFECT: contactless acquisition of information on density of dark (non-radiating) excitons in semiconductor systems of exciton polaritons.

1 cl, 2 dwg