FIELD: optoelectronic instrument making.
SUBSTANCE: invention relates to optoelectronic instrumentation and relates to a method of protecting an optoelectronic device from laser radiation. When implementing the method, optical radiation is received by an optoelectronic device and divided into two flows in energy proportions P1=K3P2 and P1>>P2. First flow is delayed relative to the second flow for the specified time tdel. Power of the second flow P2 is measured, power of the first flow is determined as P1=K3P2 and power P1 is compared with threshold value Pthr. If P1<Pthr, optical radiation of the first flow is processed by optoelectronic means. If P1≥Pthr, a signal from the radiation power sensor is transmitted to the rotary platform control unit to change the position of the power mirror, which for the protection of the optoelectronic device shuts off the first optical flow P1 and directs it in time t<tdel to the reflecting element, which simulates the process of destruction under the effect of optical radiation of the most vulnerable element from the composition of the optoelectronic device.
EFFECT: higher efficiency of protection of optoelectronic device against damage by laser radiation.
1 cl, 2 dwg
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Authors
Dates
2025-04-08—Published
2024-04-25—Filed