FIELD: measuring.
SUBSTANCE: invention relates to measurement equipment and relates to a method for monitoring localized electronic states of carbon diamond-like thin films. Method consists in measurement of local volt-ampere dependences and their analysis. At that, the fluctuation current component extracted from the local volt-ampere dependence is subjected to analysis by its spectral analysis, detecting spectral density peaks and determining a periodicity parameter which is a voltage gain causing electron transfer in a system of localized electronic states.
EFFECT: high reliability of analysing localized electronic states in the band gap of the carbon diamond-like condensate.
1 cl, 5 dwg, 1 tbl
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