METHOD OF MEASUREMENT OF SPATIAL DISTRIBUTION OF ABSOLUTE SENSITIVITY OF PHOTODETECTORS AND DEVICE TO REALIZE IT Russian patent published in 1995 - IPC

FIELD: optical photometry. SUBSTANCE: parametric scattering of laser radiation in nonlinear crystal is used in accord with method. Selection of scattered radiation in direction of propagation of components of waves is performed after crystal and one-to-one correspondence between coordinates x, x¹ of focal plane of optical system, on the one hand, and frequency ω, ω¹, on the other, is established by formula given in description of invention. Device to realize method includes nonlinear crystal, two devices to send scattered radiation to input holes of photodetectors optically coupled to nonlinear crystal via optical system, three scanning circuits mechanically coupled to two input and one output holes of sending devices, delay circuit, coincidence circuit coupled to two registration units, automation and control unit coupled to scanning circuits, delay circuit and registration unit of auxiliary photodetector. Spectrum-selecting device is positioned between input hole of sending device and auxiliary photodetector. EFFECT: expanded field of application of method, improved efficiency of device for its realization. 2 cl, 3 dwg