X-RAY METHOD OF MEASUREMENT OF THICKNESS OF MATERIAL Russian patent published in 1995 - IPC

FIELD: instrumentation. SUBSTANCE: samples of constant composition are irradiated by radiation of first energy, flux of backwardly scattered radiation is registered and dependence of flux of backwardly scattered radiation on thickness of samples under first energy of radiation is plotted. Value of second energy of radiation for which thickness of tested material is saturated layer is determined. Tested material and sample of saturated thickness are irradiated by radiation of second energy, fluxes of backwardly scattered radiation are registered and their relationship is found. By value of this relationship value of third energy of radiation is determined. Tested material is subjected to radiation of third energy, value of flux of backwardly scattered radiation is registered by which thickness of tested material is found with the aid of dependence of flux of backwardly scattered radiation on thickness of samples under first energy of irradiation. Value of second energy of radiation is found by calibration dependence and by known range of change of thickness of tested material and effective atomic number. EFFECT: improved efficiency and authenticity of method. 1 dwg