METHOD OF TEST OF VALUE OF QUARTER-WAVELENGTH STRESS IN ELECTROOPTICAL CRYSTALS Russian patent published in 1997 - IPC

FIELD: measurement technology. SUBSTANCE: invention is means to check value of controlling voltage in electrooptical crystals which are parts of polarization analyzers and light deflectors. In agreement with method light is passed through two polarizers, one being installed ahead of electrooptical crystal in path of ray and second one, polarizer-analyzer after it. Direction of transmission of the latter amounts to 45 deg with axes induced by supply of alternating voltage to electrooptical crystal. Light hits spectrograph and is directed to photodetector. Intensity of light is registered, electrooptical crystal is controlled and values of voltage and temperature are measured in process of examinations. In this case such value of controlling voltage different for different temperatures is chosen at which intensity of light registers under coaxial position of polarizer and analyzer and supplied voltage amounts to exactly half of intensity with de-energized analyzer and at which variations of light intensity ahead of electrooptical crystal of polarizer are minimal or are absent. EFFECT: enhanced efficiency of method. 2 dwg