X-RAY DIFFRACTOMETER Russian patent published in 1999 - IPC

FIELD: X-ray diffraction equipment, applicable in determination of stresses, texture and phase composition of materials, structures and articles. SUBSTANCE: the X-ray diffractometer uses an X-ray source and an analyzer; at least two radiation sources are matched with the analyzer, it uses also a protection plate with a diaphragm located in the equatorial region of the analyzer. The radiation sources are located in the holes of the hemispherical analyzer, one of which is made in the region of the pole in the axis of symmetry of the diffractometer, and the other - in the region of the equator. The X-ray diffractometer represents a monoblock-analyzer, in which the X-ray sources are integrated with the analyzer. EFFECT: simplified design, possibility of hand carrying and measurements in actual conditions of parameters of material of parts, assemblies and structures. 1 dwg