PROCESS OF IDENTIFICATION OF X-RAY REFLEXES ON HEMISPHERICAL SURFACE Russian patent published in 1999 - IPC

FIELD: X-ray and diffractometric studies. SUBSTANCE: high accuracy of determination of coordinates of X-ray reflex is achieved due to recording of spatial distribution of X-ray quanta with continuous anode-resistive layer of discrete collection of information by linear-coordinate detector. Reduced time of exposure for collection of needed set of information is obtained thanks to simultaneous recording of quanta of diffracted X-ray radiation practically for all crystallographic densities appeared to be under Bragg law. EFFECT: provision for high accuracy of determination of coordinates of X-ray reflexes, reduced time of exposure during X-ray and diffractometric studies. 1 dwg