DEVICE FOR X-RAY/FLUORESCENT ANALYSIS Russian patent published in 1999 - IPC

FIELD: X-ray/fluorescent analysis of substances. SUBSTANCE: invention relates to X-ray polarization spectrometers. Device has X-ray radiation source, scatterer-polarizer in the form of sphere, sample holder, detector with collimator and recording equipment. Source and detector are located in diametrically opposite points of sphere. Partition with through slit whose axis passes through source is placed between scatterer-polarizer and sample holder. Slit is meant to let radiation of scatterer-polarizer pass to sample holder. Sample holder can position sample on circumference of section of sphere with plane passing through detector perpendicular to slit axis. In this case slit axis passes through point of section diametrically opposite to detector. Collimator of detector is aimed at sample holder and can include one or several plane-parallel channels. Given X-ray polarization spectrometer with spherical scatterer-polarizer makes it possible to decrease detection thresholds and to expand range of simultaneously detected substances thanks to more effective suppression of background scattered from radiation sample (higher degree of polarization of radiation). Background under analytical peaks and loading of detector with radiation scattered from sample reduce by one order as compared with spectrometers with direct excitation of characteristic radiation. EFFECT: decreased detection thresholds and expanded range of substances detected simultaneously. 1 cl, 1 dwg