FIELD: SHF electronics. SUBSTANCE: method can be used for measurement of electrodynamic parameters of slow-wave systems. Method consists in excitation of cavity resonator with slow-wave system by SHF oscillations in specified frequency range fed from SHF oscillator through high-frequency measurement path and probe. All resonance frequencies and Q-factors on these frequencies are measured and recorded. Electrodynamic parameters of slow-wave system are found by known relations and dispersing dependencies of these parameters within preset range are plotted. EFFECT: measurement of electrodynamic parameters of slow-wave system with use of resonance method under condition of short-circuit of ends of slow-wave system to walls of resonator. 4 dwg, 3 tbl
