METHOD FOR MEASURING PARAMETERS OF DELAYING SYSTEMS Russian patent published in 2000 - IPC

Abstract RU 2156473 C1

FIELD: microwave equipment. SUBSTANCE: method involves excitation of delaying system, which is short circuited at its end, by means of microwave oscillations produced by microwave oscillator in given frequency band. Then, method involves measuring fixed frequencies fom in this band, measuring delay rates nm for measured frequencies using equations, and building variation characteristic n= n(f) using calculated values of nm. In addition, method involves measuring all serial resonance frequencies fom of short-circuited delaying system as dipole, measuring real parts Rm of input resistance of dipole for frequency fom. In addition, about each serial resonance frequency fom, method involves measuring upper frequency fmu and lower frequency fml for which imaginary parts of input resistance of dipole are equal to Xm(fmu) = Rm and Xm(fmu) = -Rm respectively. Then, method involves detection of electrodynamic characteristics of delaying system for each serial resonance frequency fom using given equations. This results in possibility to measure electrodynamic parameters of delaying systems in normal operational location, when input parameters of short-circuited dipole are measured. EFFECT: increased functional capabilities. 4 dwg

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RU 2 156 473 C1

Authors

Pomazkov A.P.

Korotkikh B.P.

Dates

2000-09-20Published

1999-03-29Filed