FIELD: measurement technology, SHF electronics. SUBSTANCE: process can be used to measure dispersion characteristics of slow-wave structures. Device for realization of process has meter of reflection factor, high- frequency measurement path, used section of regular transmission line, phase shifter and active load Rl connected in series and to first output of meter 1 of reflection factor and wave-meter linked to second output of meter 1 of reflection factor. Process of determination of dispersion characteristics consists in excitation of tested transmission line 4 in specified range of frequencies by SHF oscillations from meter 1 of reflection factor via high-frequency measurement path 2 loaded with resistor Rl, in measurement of frequencies f1m of minimal value of romin1m of summary reflection factor from input of transmission line, in change of phase of load Rl by phase inverter by preset value ξmπ, in repeat measurement of frequencies f2m of minimal value romin2m of summary reflection factor, in determination of moderation factor nm in each subrange by known relations and in construction of characteristics by computed values nm. EFFECT: measurement of dispersion characteristics under conditions corresponding to operation mode of slow-wave structures at standard working position. 4 dwg, 2 tbl
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Authors
Dates
1999-08-27—Published
1997-02-20—Filed