FIELD: study of materials. SUBSTANCE: pulse beam of positrons having pulse duration in nanosecond range is focused and irradiated on to rear surface of thin-film specimen and sonde is brought in contact with front surface of specimen. Surface positrons collect in narrow clearance in point of contact to form molecules of positronium Ps, with n being integral number equal to or more than 2. Gamma rays of coherent annihilation of molecules generated as result of annihilation of molecules of positronium Ps are detected to separate molecules of positronium Ps from positrons and positroniums Ps measuring by this physical properties of surface layer of material at atomic level with response time shorter than one nanosecond. EFFECT: capability to register state of localized electrons in surface layer of material at atomic level and to record processes in surface layer such as catalytic activity with response time shorter than one nanosecond. 4 cl, 1 dwg
