DEVICE TESTING ROUGHNESS OF SURFACE OF ARTICLE Russian patent published in 2000 - IPC

FIELD: measurement technology. SUBSTANCE: device incorporates optical system. Optical system includes illuminator 1, couplers 2, 3 of incident and reflected radiation and electron unit 5. Radiator of illuminator is monochromatic. Electron unit is made of photoconverters 6, 7 of part of incident and reflected radiation, commutator 8, register 13, power supply source 14, analog-to-digital converter 9, microcontroller 10, interface controller 11 and power-independent storage 12. Measurements are conducted in real time by calibration curves stored in power-independent storage thanks to computation of reflection factor independent of instability of radiation of illuminator. EFFECT: expanded functional capabilities and simplified design of device for contact- free measurement of roughness of surfaces. 1 cl, 1 dwg