FIELD: radioelectronic engineering. SUBSTANCE: method involves reproducing testing action of electrostatic discharges by means of modeling installation. Radioelectronic apparatus members are exposed to stationary ionizing radiation and then, their annealing is carried out in switched-on static state before setting them into the apparatus and making their assemblage. The absorbed dose of the ionizing radiation is determined from known formula. EFFECT: high reliability of test results.
Title | Year | Author | Number |
---|---|---|---|
METHOD FOR DETERMINING THE RESISTANCE OF STRUCTURAL ELEMENTS OR RADIO-ELECTRONIC EQUIPMENT OF LOW-ORBIT SPACECRAFT TO THE INFLUENCE OF SPACE FACTORS AND A DEVICE FOR ITS IMPLEMENTATION | 2022 |
|
RU2791950C1 |
METHOD FOR TESTING SECONDARY ELECTRICAL POWER SOURCES OF RADIO ELECTRONIC EQUIPMENT FOR RESISTANCE TO THE EFFECTS OF A PULSE OF GAMMA RADIATION OF SIMULATING INSTALLATIONS | 2020 |
|
RU2745255C1 |
METHOD OF DETERMINING STANDARD OF TESTING ELECTRONIC PRODUCTS FOR COMPLIANCE WITH REQUIREMENTS FOR RESISTANCE TO DOSE EXPOSURE OF SUPERHARD X-RAY AND GAMMA RADIATION | 2024 |
|
RU2828230C1 |
METHOD FOR TESTING RADIO-ELECTRONIC EQUIPMENT FOR RESISTANCE TO THE IMPACT OF A PULSE OF GAMMA RADIATION | 2022 |
|
RU2778744C1 |
DEVICE FOR GENERATING SOFT X-RAYS | 2000 |
|
RU2193828C2 |
METHOD FOR BLOCK TESTS OF RADIO-ELECTRONIC EQUIPMENT FOR RESISTANCE TO IMPACT OF PULSE GAMMA-RADIATION ON MODELING INSTALLATIONS | 2021 |
|
RU2783978C1 |
METHOD OF DETERMINING ENERGY SPECTRUM OF GAMMA QUANTA | 2012 |
|
RU2497157C1 |
METHOD OF REJECTING SEMICONDUCTOR DEVICES FOR RADIATION RESISTANCE | 2003 |
|
RU2253875C2 |
METHOD FOR MODELING PULSATING IONIZING RADIATION UPON INTEGRAL MICROCIRCUIT ON COMPLEMENTARY METAL- OXIDE-SEMICONDUCTOR STRUCTURES | 1998 |
|
RU2174691C2 |
METHOD OF DETERMINING LOCATION AND ACTIVITY OF POINT SOURCES OF GAMMA RADIATION ON THE AREA | 2024 |
|
RU2838014C1 |
Authors
Dates
2000-10-10—Published
1999-11-12—Filed