FIELD: radio engineering.
SUBSTANCE: invention relates to a method for testing of radio-electronic equipment (hereinafter – REE) for resistance to impact of pulse gamma-radiation (hereinafter – PGR). When implementing the method, quasi-nominal supply voltage with duration Δτ is replaced with constant supply voltage, and subsequent two-stage irradiation of REE blocks is carried out. At the first stage, REE blocks are irradiated with PGR at constant supply voltage, wherein the resistance of REE blocks is assessed according to the criterion of occurrence of radiation snapping and catastrophic failures. In case of resistance of REE blocks to PGR impact after the first stage, the second stage of tests is carried out, at which REE blocks are irradiated with PGR with simultaneous reproduction of an amplitude-time characteristic of supply voltage of REE blocks, corresponding to radiation reaction of a secondary power supply source (hereinafter – SPSS) of REE blocks under PGR impact. Resistance of REE blocks is assessed according to the criterion of failure occurrence. Radiation reaction of SPSS of REE blocks under PGR impact, necessary for reproduction, is determined, when irradiating SPSS with PGR load equivalent. In case of resistance of REE blocks to PGR impact after the second stage, a conclusion is made about resistance of REE to PGR impact in general.
EFFECT: provision of safety margin of REE tests for resistance to PGR impact.
1 cl, 2 dwg
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Authors
Dates
2022-11-22—Published
2021-11-11—Filed