FIELD: electronics. SUBSTANCE: method of switchover of leadout pins of crystal of integrated circuit to satisfy test requirements of manufacturer to switchover of leads-out consists in parallel loading of tester of integrated circuit into shift register of peripheral scanning of integrated circuit so that data loaded in parallel are alternating high- and low-level bits of data. Test combination of alternating bits of data is then fixed in data fixing register and is sent to leadout pins of crystal of integrated circuit. Later test combination is shifted by one bit in shift register of integrated circuit and is loaded in parallel into fixing register in next period of synchronization. Thus addition to test combination fed to leadout pins of internal testing circuit is sent from crystal of integrated circuit. Then this process is repeated once again to ensure alternating switchover for each leadout pin on crystal of integrated circuit. EFFECT: simplified method and enhanced reliability of testing of integrated circuits. 6 cl, 5 dwg
