FIELD: measurement technology. SUBSTANCE: invention refers to resonance method of measurement of low capacitance on high frequencies under action of high temperature, pressure and radiation. Method consists in placement of line with distributed parameters whose length amounts to odd number of quarters of wavelengths of high-frequency signal and of measured capacitance into isolated volume, in connection of peak detector to measured capacitance with the aid of metal buses, in positioning of peak detector outside of isolated volume, in action of high temperature, pressure and radiation on measured capacitance and in remote measurement of low capacitance on high frequencies by known method. EFFECT: provision for remote measurement of low capacitance on high frequencies under action of destabilizing factors of high temperature, pressure and radiation. 6 dwg, 2 tbl
