FIELD: measurement technology. SUBSTANCE: technical objective of invention lies in provision for expansion of measurement range of low capacitance on high frequencies at some distance from device and operator. This objective is achieved by way of employment of resonance at end of line with distributed parameters which length amounts to odd number of quarters of wavelength of high-frequency signal and by way of determination of resonance frequency of high-frequency resonance. EFFECT: expanded measurement range. 2 dwg, 2 tbl
