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2 190 282

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IPC

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Application

2000111987/09, 2000-05-17

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Start date

2000-05-17

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Actual filing date

2000-05-17

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Published

2002-09-27

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Inventor

Maslov A.I.Zapuskalov V.G.Luk'Janenko Eh.A.Gusev E.A.Artem'Ev B.V.Rolik V.A.Shejkin Ju.V.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Moskovskoe Nauchno-Proizvodstvennoe Ob"Edinenie

X-RAY EMITTER Russian patent published in 2002 - IPC

Abstract RU 2190282 C2

FIELD: instrumentation engineering; flaw inspection of materials. SUBSTANCE: gamma-ray output aperture is tapered, its aperture angle α is between 10 and 30 deg.; microwave oscillator rays are perpendicular to central axis of resonator. Such design makes X-ray emitter suited to inspect hard-to-get-at surfaces of parts having complex configuration. EFFECT: enhanced reliability of local flaw inspection. 3 dwg

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RU 2 190 282 C2

Authors

Maslov A.I.

Zapuskalov V.G.

Luk'Janenko Eh.A.

Gusev E.A.

Artem'Ev B.V.

Rolik V.A.

Shejkin Ju.V.

Dates

2002-09-27—Published

2000-05-17—Filed

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