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2 189 008

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Application

2000132155/28, 2000-12-22

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Start date

2000-12-22

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Actual filing date

2000-12-22

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Published

2002-09-10

(72)

Inventor

Maslov A.I.Zapuskalov V.G.Egorov I.V.Artem'Ev B.V.Rolik V.A.Fedorov V.A.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Moskovskoe Nauchno-Proizvodstvennoe Ob"Edinenie

X-RAY THICKNESS GAUGE Russian patent published in 2002 - IPC

Abstract RU 2189008 C1

FIELD: X-ray measurement technology. SUBSTANCE: X-ray thickness gauge is supplemented with feedback automatically controlled by value of output electric signal from amplifier of compensation channel technically secured by insertion of actuating mechanism, by implementation and position of calibrated filter with uniformly increasing ( decreasing ) thickness towards angular coordinate of plane of filter. EFFECT: enhanced measurement precision. 1 cl, 1 dwg

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RU 2 189 008 C1

Authors

Maslov A.I.

Zapuskalov V.G.

Egorov I.V.

Artem'Ev B.V.

Rolik V.A.

Fedorov V.A.

Dates

2002-09-10—Published

2000-12-22—Filed

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