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2 184 934

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Application

2000114311/28, 2000-06-08

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Start date

2000-06-08

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Actual filing date

2000-06-08

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Published

2002-07-10

(72)

Inventor

Maslov A.I.Zapuskalov V.G.Egorov I.V.Artem'Ev B.V.Rolik V.A.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Moskovskoe Nauchno-Proizvodstvennoe Ob"Edinenie

THICKNESS GAUGE Russian patent published in 2002 - IPC

Abstract RU 2184934 C2

FIELD: measurement technology. SUBSTANCE: thickness gauge has X-ray radiator coming in the form of high-voltage generator and X-ray tube connected to output of generator, X-ray detector, tested article located between X-ray radiator and X-ray detector, amplifier coupled by input to output of X-ray detector and recorder connected in series. In addition thickness gauge incorporates control unit with automatic test function which input is connected to output of X-ray detector and which output is connected to input of high-voltage generator which so controls output voltage of generator that there exists quasi-linear dependence of electric signal on change of thickness of tested article. EFFECT: high-speed and authenticity of measurement of moving sheet articles directly at place of their production. 1 dwg

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RU 2 184 934 C2

Authors

Maslov A.I.

Zapuskalov V.G.

Egorov I.V.

Artem'Ev B.V.

Rolik V.A.

Dates

2002-07-10—Published

2000-06-08—Filed

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