PROCEDURE OF DIAGNOSTICS OF TEMPERATURE MEASURING CIRCUITS Russian patent published in 2003 - IPC

FIELD: instrumentation. SUBSTANCE: proposed procedure can be used in technological processes at enterprises where test of authenticity of readings of temperature-sensitive elements and test of temperature measuring circuits are required. Given procedure is based on comparison of tested and reference circuits connected to point of connection of temperature- sensitive element monitoring technological process or on comparison of voltage fed from reference voltage source with subsequent shorting of points of connection of temperature-sensitive elements to determine authenticity of readings of temperature-sensitive element and to test temperature measuring circuits. For test of thermocouple after connection of voltage source and its disconnection points of connection of thermocouple are short-circuited, thermometer measuring ambient temperature is placed in immediate proximity. Diagnostic table is constructed by results of measurement, its analysis enables faulty unit, element and character of fault to be detected or conclusion on correctness of readings of temperature-sensitive element and on correctness of conducted measurements to be made. EFFECT: decreased number of measurements, reduced time of detection of faulty unit. 1 cl