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2 215 991

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Application

2001124755/28, 2001-09-11

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Start date

2001-09-11

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Actual filing date

2001-09-11

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Published

2003-11-10

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Inventor

Maslov A.I.Artem'Ev B.V.Zapuskalov V.G.Egorov I.V.Rolik V.A.Volchkov Ju.E.Vedernikov B.G.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Nauchno-Issledovatel'Skij Institut Introskopii Moskovskogo Nauchno-Proizvodstvennogo Ob"Edinenija

X-RAY THICKNESS GAUGE Russian patent published in 2003 - IPC

Abstract RU 2215991 C2

FIELD: X-ray measurement technology. SUBSTANCE: specific feature of gauge lies in that body of ionization chamber and shield of cable coupling output of chamber to noninverting input of amplifier are connected to output of amplifier and its inverting input and are insulated from ground. EFFECT: enhanced measurement accuracy.

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RU 2 215 991 C2

Authors

Maslov A.I.

Artem'Ev B.V.

Zapuskalov V.G.

Egorov I.V.

Rolik V.A.

Volchkov Ju.E.

Vedernikov B.G.

Dates

2003-11-10—Published

2001-09-11—Filed

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