Patenton — panteon of patents

(19)

RU

(11)

2 272 992

(13)

C1

(51)

IPC

G01B15/02(2006-01-01)

(21) (22)

Application

2004133280/28, 2004-11-16

(24)

Start date

2004-11-16

(22)

Actual filing date

2004-11-16

(45)

Published

2006-03-27

(72)

Inventor

Maslov Aleksandr IvanovichZapuskalov Valerij Grigor'EvichArtem'Ev Boris ViktorovichVolchkov Jurij Evgen'Evich

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Nauchno-Issledovatel'Skij Institut Introskopii Moskovskogo Nauchno-Proizvodstvennogo Ob"Edinenija Niiin Mnpo

X-RAY THICKNESS METER FOR MEASURING THICKNESS OF HOT-ROLLED SHEETS Russian patent published in 2006 - IPC G01B15/02 

Abstract RU 2272992 C1

FIELD: non-destructive inspection methods.

SUBSTANCE: device has X-ray radiation source, two radiation detectors disposed at both sides of inspected sample, and processing circuit. Device also has contact-free temperature detector and processor, which has one input connected with output of processing circuit. The other output of processor is connected with output of temperature detector.

EFFECT: improved precision of measurement.

1 dwg

Similar patents RU2272992C1

Title Year Author Number
X-RAY THICKNESS GAUGE 2000
  • Artem'Ev B.V.
  • Vedernikov B.G.
  • Egorov I.V.
  • Zapuskalov V.G.
  • Krasil'Nikov S.B.
  • Maslov A.I.
  • Rolik V.A.
 RU2159408C1
X-RAY THICKNESS GAUGE 2000
  • Maslov A.I.
  • Zapuskalov V.G.
  • Egorov I.V.
  • Artem'Ev B.V.
  • Rolik V.A.
  • Fedorov V.A.
 RU2189008C1
X-RAY THICKNESS INDICATOR 2000
  • Maslov A.I.
  • Zapuskalov V.G.
  • Egorov I.V.
  • Trojanovskij Ja.I.
  • Artem'Ev B.V.
  • Rolik V.A.
  • Volchkov Ju.E.
 RU2179706C1
X-RAY TYPE THICKNESS GAGE 2001
  • Maslov A.I.
  • Zapuskalov V.G.
  • Egorov I.V.
  • Artem'Ev B.V.
  • Volchkov Ju.E.
 RU2210059C1
DEVICE FOR X-RAY INSPECTION OF THICKNESS OF SHEET ITEMS 2004
  • Maslov A.I.
  • Zapuskalov V.G.
  • Artem'Ev B.V.
  • Volchkov Ju.E.
  • Gusev V.E.
 RU2259538C1
X-RAY THICKNESS GAUGE 2002
  • Maslov A.I.
  • Zapuskalov V.G.
  • Vladimirov L.V.
  • Gusev E.A.
  • Artem'Ev B.V.
  • Volchkov Ju.E.
  • Bojarintsev D.S.
  • Ivanov D.P.
 RU2215260C1
x-RAY THICKNESS GAUGE 2000
  • Artem'Ev B.V.
  • Egorov I.V.
  • Zapuskalov V.G.
  • Maslov A.I.
  • Rolik V.A.
 RU2172930C1
APPARATUS FOR ULTRASOUND CONTACT-FREE MEASURING OF ROLLED FOIL AND POLYMER FILMS THICKNESS VALUE 2005
  • Kazintsev Vladimir Aleksandrovich
 RU2314493C2
CALIBRATION STAND FOR X-RAY THICKNESS GAUGE 2006
  • Maslov Aleksandr Ivanovich
  • Zapuskalov Valerij Grigor'Evich
  • Artem'Ev Boris Viktorovich
  • Sozontov Aleksandr Aleksandrovich
 RU2327953C1
EDDY-CURRENT THICKNESS GAUGE 0
  • Klyuev Vladimir Vladimirovich
  • Fedosenko Yurij Kirillovich
  • Korovyakov Viktor Aleksandrovich
  • Arbuzov Viktor Olegovich
 SU1087768A1

RU 2 272 992 C1

Authors

Maslov Aleksandr Ivanovich

Zapuskalov Valerij Grigor'Evich

Artem'Ev Boris Viktorovich

Volchkov Jurij Evgen'Evich

Dates

2006-03-27—Published

2004-11-16—Filed

download Download PDF read Similar patents