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2 210 059

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IPC

(21) (22)

Application

2001132220/28, 2001-11-30

(24)

Start date

2001-11-30

(22)

Actual filing date

2001-11-30

(45)

Published

2003-08-10

(72)

Inventor

Maslov A.I.Zapuskalov V.G.Egorov I.V.Artem'Ev B.V.Volchkov Ju.E.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Nauchno-Issledovatel'Skij Institut Introskopii Moskovskogo Nauchno-Proizvodstvennogo Ob"Edinenija

X-RAY TYPE THICKNESS GAGE Russian patent published in 2003 - IPC

Abstract RU 2210059 C1

FIELD: testing thickness of belts or webs in static or dynamic mode. SUBSTANCE: thickness gage includes in addition nominal value unit. Active member of differentiating circuit is in the form of first and second connected in series field transistors whose gates are connected with outlet of nominal value unit. Drain of first transistor and source of second transistor are connected with first inlet of third amplifier. EFFECT: enlarged range of measurement, enhanced quick-action of testing, increased noise suppression in dynamic mode. 2 cl, 2 dwg

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RU 2 210 059 C1

Authors

Maslov A.I.

Zapuskalov V.G.

Egorov I.V.

Artem'Ev B.V.

Volchkov Ju.E.

Dates

2003-08-10—Published

2001-11-30—Filed