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2 259 538

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Application

2004129995/28, 2004-10-12

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Start date

2004-10-12

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Actual filing date

2004-10-12

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Published

2005-08-27

(72)

Inventor

Maslov A.I.Zapuskalov V.G.Artem'Ev B.V.Volchkov Ju.E.Gusev V.E.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Nauchno-Issledovatel'Skij Institut Introskopii Moskovskogo Nauchno-Proizvodstvennogo Ob"Edinenija Niiin Mpno

DEVICE FOR X-RAY INSPECTION OF THICKNESS OF SHEET ITEMS Russian patent published in 2005 - IPC

Abstract RU 2259538 C1

FIELD: non-destructive inspection; X-ray technology.

SUBSTANCE: device has X-ray radiation source, first and second radiation detectors, processing circuit and registrar. Detectors with different spectral sensitivities are used. The detectors are disposed one after another in such a way to make contact to each other at the side being opposite to where X-ray source is located.

EFFECT: improved precision of measurement; improved sensitivity.

1 dwg

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RU 2 259 538 C1

Authors

Maslov A.I.

Zapuskalov V.G.

Artem'Ev B.V.

Volchkov Ju.E.

Gusev V.E.

Dates

2005-08-27—Published

2004-10-12—Filed

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