X-RAY THICKNESS INDICATOR Russian patent published in 2002 - IPC

FIELD: measurement technology, measurement of thickness of bands and strips made of various materials both in statics and dynamics. SUBSTANCE: given thickness indicator incorporates receivers, X-ray radiator, amplifiers, processing circuit, correction unit and register. Processing circuit includes subtracter, adder and divider whose output is output of processing circuit and whose first and second inputs are connected correspondingly to outputs of subtracter and adder. Output of first receiver is connected to first inputs of subtracter and adder via first amplifier. Output of second receiver is connected to second inputs through second amplifier. Correction unit has differential network comprising first capacitor and resistor connected in series and third amplifier whose first input is connected to differential network in point of connection of capacitor and resistor and whose output is linked to input of key. First output of key is connected to input of fourth amplifier, second input of key is coupled via capacitor to output of fourth amplifier to form output of correction unit. In this case tested article is placed between receivers. EFFECT: increased stability, speed of measurement and accuracy of inspection. 2 dwg