INFRARED RADIATION CONTROLLED CIRCUIT ( VARIANTS ), INFRARED RADIATION DETECTOR AND METHOD OF EMPLOYMENT OF INFRARED RADIATION BASED ON SiC Russian patent published in 2003 - IPC

Abstract RU 2218631 C2

FIELD: measurement of power or energy of infrared radiation and temperature. SUBSTANCE: body of SiC crystal reacts to incident infrared radiation changing its reaction to electric signal. Body of SiC crystal is fixed in mounting fixture which includes AlN substrate and current-conducting mounting layer containing W, WC or W2C2 which links body of SiC crystal electrically and mechanically to substrate. EFFECT: capability to operate at high temperature without any air or water cooling, measurement of high-power infrared radiation, resistance to thermal shock with minimization of dimensions of detector. 11 cl, 9 dwg

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RU 2 218 631 C2

Authors

Parsons Dzhejms D.

Dates

2003-12-10Published

2000-03-20Filed