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2 159 408

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IPC

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Application

2000108585/28, 2000-04-10

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Start date

2000-04-10

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Actual filing date

2000-04-10

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Published

2000-11-20

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Inventor

Artem'Ev B.V.Vedernikov B.G.Egorov I.V.Zapuskalov V.G.Krasil'Nikov S.B.Maslov A.I.Rolik V.A.

(73)

Holder

Zakrytoe Aktsionernoe Obshchestvo Moskovskoe Nauchno-Proizvodstvennoe Ob"Edinenie

X-RAY THICKNESS GAUGE Russian patent published in 2000 - IPC

Abstract RU 2159408 C1

FIELD: measurement technology. SUBSTANCE: invention is intended to test thickness of tapes, bands, canvases and the like in statics and dynamics. Salient feature of invention lies in supplementation of gauge with additional radiation detector and amplifier and in manufacture of processing circuit in the form of subtracter, adder and divider. EFFECT: high reliability of test and improved metrological characteristics of gauge. 1 dwg

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RU 2 159 408 C1

Authors

Artem'Ev B.V.

Vedernikov B.G.

Egorov I.V.

Zapuskalov V.G.

Krasil'Nikov S.B.

Maslov A.I.

Rolik V.A.

Dates

2000-11-20—Published

2000-04-10—Filed

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