THIN-FILM MEASURING RESISTOR Russian patent published in 2007 - IPC H01C17/75 

FIELD: microelectronics, measurement technology, electronic industry, and measurement electronics.

SUBSTANCE: proposed thin-film measuring resistor has resistive layer on dielectric substrate in the form of meander made of Nichrome or any other resistive material with aluminum layer applied to its edges to function as contacts for connecting current flowing through resistor. Additionally introduced in resistor are resistive layers for receiving and averaging potential along current line in boundary area of current contact; these layers are made of same material as resistive material in the form of resistor-extending strips perpendicular to direction of resistor input and output current; aluminum layers are applied to edges of these strips to function as potential contacts.

EFFECT: enhanced precision of reproducing desired resistance, simplified design of thin-film resistor.

1 cl, 3 dwg