FIELD: electric engineering.
SUBSTANCE: resistance measuring method includes letting a current of given value through edge and middle electrodes of thin-film resistor with three electrodes. Voltage is measured between middle and second edge electrodes. Transitive resistance of contact is determined according to formula 
where φB - measured voltage, I - current of given value, K - coefficient, reverse of coefficient a11 of chain matrix, produced as a result of electric modeling of contact area.
EFFECT: increased precision when measuring transitive resistance of a contact of thin-film resistor.
3 dwg
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD FOR DETERMINATION OF JUNCTION RESISTANCE OF CONTACT TO THIN-FILM RESISTORS WITH ELECTRODES | 1987 |
|
SU1538703A1 |
| PROCESS OF FABRICATION OF TUNABLE THIN-FILM RESISTOR | 2002 |
|
RU2231151C2 |
| PRECISE THIN-FILM RESISTOR | 2010 |
|
RU2421837C1 |
| METHOD FOR MONITORING THE RESISTANCE OF CONTACT PAIRS OF MOBILE CONTACT APPARATUS | 2021 |
|
RU2775376C1 |
| THIN-FILM MEASURING RESISTOR | 2005 |
|
RU2306624C1 |
| METHOD OF MAKING THIN-FILM RESISTOR | 2008 |
|
RU2374710C1 |
| METHOD FOR MANUFACTURING THIN-FILM RESISTOR | 2000 |
|
RU2208256C2 |
| METHOD TO MANUFACTURE WIRE MEASUREMENT RESISTOR | 2012 |
|
RU2504035C1 |
| FILM RESISTOR TRIMMING METHOD | 2001 |
|
RU2190273C1 |
| METHOD OF DETERMINING THERMAL IMPEDANCE OF VERY LARGE SCALE INTEGRATED CIRCUITS - MICROPROCESSORS AND MICROCONTROLLERS | 2012 |
|
RU2521789C2 |
