FIELD: optical instrument engineering; optical radiation transformers; thermal image transformers in crystals.
SUBSTANCE: device can be used for measurement of optical characteristics depending on optical sign of crystal. Device has following members mounted in perpendicular to axis of optical system and disposed in series: monochromatic radiation source, polarizer, compensator, dissipater, tested crystal plate, analyzer and screen. Compensator is made in form of flat-parallel crystal plate having known optical sign. Compensator is mounted for rotation about its crystal physical axis being perpendicular to axis of optical crystal. Axes of transmission of polarizer and analyzer are disposed in perpendicular to each other.
EFFECT: improved precision of measurement of optical sign of crystal relatively its entrance face; widened functional capabilities.
2 dwg
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD FOR DETERMINATION OF OPTICAL AXIS POSITION OF PHASE ANISOTROPIC CRYSTAL PLATE λ/4 | 2010 |
|
RU2442972C1 |
| METHOD FOR DETERMINATION OF OPTICAL SIGN OF CRYSTAL | 2007 |
|
RU2366916C1 |
| METHOD FOR VISUAL DETERMINATION OF OPTICAL RADIATION POLARISATION FORM | 2009 |
|
RU2401446C1 |
| METHOD TO REVEAL DEFECTS OF QUARTZ CRYSTALLINE LENS | 2007 |
|
RU2379656C2 |
| METHOD OF DETERMINING ORIENTATION OF CRYSTALLOGRAPHIC AXES IN CLASS 3m ANISOTROPIC ELECTRO-OPTICAL CRYSTAL | 2012 |
|
RU2528609C2 |
| METHOD FOR DETERMINING ROTATION SIGN OF RADIATION POLARIZATION PLANE IN OPTICALLY ACTIVE CRYSTAL | 2005 |
|
RU2288460C2 |
| ELLIPTIC POLARIZER | 0 |
|
SU1727097A1 |
| METHOD FOR DETERMINING THE "FAST" OPTICAL AXIS OF A QUARTER-WAVE PLATE | 2021 |
|
RU2775357C1 |
| METHOD OF LIGHT POLARISATION CONTROL | 2006 |
|
RU2334959C1 |
| MULTI-STANDARD LIQUID CRYSTAL STEREOSCOPIC GLASSES | 2011 |
|
RU2488150C1 |
