FIELD: measurement.
SUBSTANCE: method is employed using optical system that contains installed across its system axis polarizer, studied phase anisotropic crystal plate λ/4, phase compensator, analyzer crossed with polarizer. The diffuser is installed between studied plate and phase compensator. After turn of the studied crystal plate around the axis of optical system the resulting interference pattern has the shape of light maltese cross. The position of optical axis in the plane of input edge of studied phase anisotropic crystal plate λ/4 is determined by being parallel to the line connecting two black spots in interference pattern.
EFFECT: relatively fast determination of precise position of optical axis in the plane of input edge of studied phase anisotropic crystal plate λ/4 during mass testing of phase crystal plates of variable thickness.
1 dwg, 3 dwg
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