TEST STRUCTURE FOR ESTIMATION OF CURVATURE RADIUS OF SCANNING PROBE MICROSCOPY CANTILEVER NEEDLE-POINT Russian patent published in 2008 - IPC G01B11/255 

Abstract RU 2335735 C1

FIELD: physics.

SUBSTANCE: test structure for estimation of curvature radius of scanning probe microscopy cantilever needle-point consists of foundation with vertical needle-points. The foundation contains close-packed relief cellular near-surface layer, adjacent cells have common wall. Each cell is at least five-walled, walls of each cell are vertical, and cell wall tops are concave. Needle-points are joined in knot areas of three wall tops of various cells, curvature radius of needle-point tops is 1 to 3 nm, and needle-point heights are 20 to 100 nm. Distance between separate needle-points is 10 to 500 nm, near-surface foundation layer is made of aluminium. The foundation represents substrate with thin aluminium film containing near-surface foundation layer. The substrate is made of single-crystalline silicon.

EFFECT: improved reproducibility of cantilever needle curvature radius estimation.

4 cl, 6 dwg

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RU 2 335 735 C1

Authors

Belov Aleksej Nikolaevich

Gavrilov Sergej Aleksandrovich

Orlov Igor' Jur'Evich

Tikhomirov Aleksej Aleksandrovich

Shevjakov Vasilij Ivanovich

Dates

2008-10-10Published

2006-12-15Filed