FIELD: physics; measurement.
SUBSTANCE: invention pertains to measurement of ionising radiation and particularly gamma-radiation using gas-discharge counters. The method involves measuring radiation intensity exceeding the upper limit of the counter range while regulating supply voltage of the counter and controlling counting errors of counter signals. During a given period of time, intervals between counter signals are measured and a distribution of the intervals is obtained, from which coordinates of the first distribution maximum are determined. On the descending arm of the distribution, appearance of the second maximum is controlled. From the measurement results, gradient parametres of the distribution are calculated, and radiation intensity is determined from the gradient parametre. The device contains a gas-discharge counter, the output of which is connected to the input of a shaping amplifier, a supply unit for the gas-discharge counter and a microcontroller, the first output of which is connected a display unit. The microcontroller has a timer-counter and a device for measuring intervals. The output of the shaping amplifier is connected inputs of the timer-counter and the device for measuring intervals of the microcontroller. The supply unit of the gas-discharge counter consists of series-connected generator, power amplifier, transformer and rectifier, as well as series-connected switching regulator, integrator and direct current amplifier. The input of the switching regulator is connected to the output of power amplifier and the output of the direct current amplifier is connected to the second input of the supply unit generator, the first input of which is connected to the second output of the microcontroller. The output of the rectifier is connected to the input of the gas-discharge counter.
EFFECT: increase in the upper limit of the range of measuring radiation intensity to values of over a hundred times more than the upper limit of the range of gamma-radiation intensity of the gas-discharge counter, and simplification and decrease of the weight and size of the device which realises the given method.
3 cl, 6 dwg
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Authors
Dates
2009-07-10—Published
2007-12-25—Filed