METHOD AND DEVICE TO DETECT LEAKS IN ELECTRONIC DEVICES Russian patent published in 2010 - IPC G01M3/00 

Abstract RU 2379642 C2

FIELD: instrument making.

SUBSTANCE: invention relates to measuring and testing equipment and can be used for detection of leaks in electronic devices in nondestructive testing. Proposed method consists in using electronic device with inner space. Note here that is does not contains check (testing) gas. In compliance with this invention, it is placed in a medium containing check gas at atmospheric pressure, which, note, can diffuse into said inner space of electronic device. Electronic device can be place in medium containing not check gas at atmospheric pressure and not containing check gas. Check gas flowing from electronic device or from its inner space is detected. Note here that check and not check gas medium is formed in one chamber.

EFFECT: higher accuracy, ease of testing.

50 cl, 17 dwg

Similar patents RU2379642C2

Title Year Author Number
METHOD AND SYSTEM FOR ERECTION INTO CASING OF DEVICES ON BASIS OF MEMS WITH INTRODUCED GAS ABSORBER 2005
  • Palmatir Loren
  • Kammingz Uill'Jam Dzh.
  • Galli Brajan Dzh.
  • Chuj Klehrens
  • Kotkhari Manish
RU2379227C2
DEVICE WITH CONDUCTIVE LIGHT-ABSORBING MASK AND METHOD OF MAKING SAID DEVICE 2005
  • Kotkhari Manish
RU2389051C2
METHOD AND DEVICE FOR MOUNTING OF BASE IN CASING 2005
  • Palmatir Loren
  • Kammingz Uill'Jam Dzh.
  • Galli Brajan Dzh.
  • Majls Mark V.
  • Sempsell Dzheffri B.
  • Chuj Klehrens
  • Kotkhari Manish
RU2374171C2
MEMS DEVICES WITH SUPPORT STRUCTURES AND METHODS OF THEIR PRODUCTION 2006
  • Chuj Klarens
  • Chang Vonsak
  • Ganti Sur'Ja Prakash
  • Kotkhari Manish
  • Majlz Mark V.
  • Sehmpsel Dzhefri B.
  • Sasagava Teruo
RU2468988C2
SYSTEM AND METHOD OF PROTECTING MICROSTRUCTURE OF DISPLAY MATRIX USING PADS IN GAP INSIDE DISPLAY DEVICE 2005
  • Palmatir Loren
  • Kammingz Uill'Jam Dzh.
  • Galli Brajan Dzh.
  • Chuj Klehrens
RU2383043C2
MICROELECTROMECHANICAL SYSTEM BASED DISPLAY AND METHODS FOR PRODUCTION THEREOF 2008
  • Chang Dehniel
  • Bos Jan
  • Ganti Sur'Japrakash
  • Kotari Manish
RU2471210C2
METHOD AND APPARATUS FOR READING, MEASURING OR DETERMINING PARAMETERS OF DISPLAY ELEMENTS COMBINED WITH DISPLAY CONTROL CIRCUIT, AND SYSTEM USING SAID METHOD AND APPARATUS 2009
  • Govil' Alok
RU2526763C2
METHOD AND APPARATUS FOR READING, MEASURING OR DETERMINING PARAMETERS OF DISPLAY ELEMENTS COMBINED WITH DISPLAY CONTROL CIRCUIT, AND SYSTEM USING SAID METHOD AND APPARATUS 2009
  • Govil' Alok
RU2526708C2
MEASUREMENT OF ELECTRIC CONTROL PARAMETERS OF DISPLAY BASED ON MICROELECTROMECHANICAL SYSTEMS AND DEVICE FOR ELECTRIC MEASUREMENT OF SUCH PARAMETERS 2009
  • Govil' Alok
  • D'Erd'Ev Kostadin
  • L'Juis Alan
  • Van Lier Vil'Gel'Mus Jokhannes Robertus
RU2503068C2
INTERFEROMETRIC OPTICAL DISPLAY SYSTEM HAVING WIDE-BAND CHARACTERISTICS 2007
  • Gusev Evgenij
  • Ksju Gang
  • M'Enko Marek
RU2452987C2

RU 2 379 642 C2

Authors

Kammingz Uill'Jam Dzh.

Dates

2010-01-20Published

2005-09-26Filed