METHOD FOR MANUFACTURING AND RESTORATION OF ATOMIC-FORCE MICROSCOPE PROBES FOR CONTACT ELECTRIC MEASUREMENTS Russian patent published in 2010 - IPC B82B3/00 

Abstract RU 2381988 C1

FIELD: electricity.

SUBSTANCE: probe is brought together with surface of conductive substance in liquid condition, which properly soaks probe material and conductive coat applied on conductive substrate. Electric voltage is applied between substrate and probe, which is varied so that electric current values that correspond to more than three values of applied electric voltage are validly registered. Procedure of submersion is terminated, when registered non-zero electric current within the limits of experimental error becomes proportional to applied voltage, afterwards probe is withdrawn from conductive substance in liquid condition. As a result of this, probe tip becomes coated with conductive substance in liquid condition. Drying of produced layer results in formation of smooth surface.

EFFECT: production of stable electric contact of probe with investigated surface, provision of high stability and repeatability of electric measurements.

3 dwg

Similar patents RU2381988C1

Title Year Author Number
MEASURING PROBE AND METHOD OF ITS MANUFACTURE 2017
  • Borodzyulya Valerij Florianovich
  • Moshnikov Vyacheslav Alekseevich
  • Permyakov Nikita Vadimovich
RU2654385C1
POINT STRUCTURES, DEVICES BUILT AROUND THEM, AND THEIR MANUFACTURING METHODS 2000
  • Givargizov E.I.
  • Givargizov M.E.
RU2240623C2
METHOD OF CONTACT RESISTANCE MEASURMENT 2007
  • Baturin Andrej Sergeevich
  • Ljubovin Nikolaj Jur'Evich
  • Spiridonov Maksim Viktorovich
  • Sheshin Evgenij Pavlovich
RU2334238C1
METHOD OF MAKING CONDUCTIVE COATING ON SURFACE OF PROBE FOR ATOMIC FORCE MICROSCOPY 2023
  • Kozodaev Dmitrij Aleksandrovich
  • Yakovleva Anastasiya Aleksandrovna
  • Bobkov Anton Alekseevich
  • Ryabko Andrej Andreevich
  • Moshnikov Vyacheslav Alekseevich
  • Korepanov Oleg Alekseevich
RU2825297C1
METHOD OF MEASURING NANOPARTICLE TEMPERATURE 2010
  • Akchurin Garif Gazizovich
  • Akchurin Georgij Garifovich
RU2431151C1
DEVICE AND METHOD FOR COAT APPLICATION ONTO PROBING NEEDLE 2008
  • Lipanov Aleksej Matveevich
  • Guljaev Pavel Valentinovich
  • Shelkovnikov Evgenij Jur'Evich
  • Gudtsov Denis Vjacheslavovich
  • Gafarov Marat Renatovich
  • Zobova Ljudmila Nikolaevna
RU2363546C1
WALKING ROBOT-NANOPOSITIONER AND METHOD OF CONTROLLING MOVEMENT THEREOF 2010
  • Lapshin Rostislav Vladimirovich
RU2540283C2
CANTILEVER WITH WHISKER PROBE AND METHOD FOR MANUFACTURING SAME 1999
  • Givargizov Evgenij Invievich
  • Obolenskaja Lidija Nikolaevna
  • Stepanova Alla Nikolaevna
  • Mashkova Evgenija Sergeevna
  • Givargizov Mikhail Evgen'Evich
RU2275591C2
CALIBRATING MASTER FOR PROFILOMETRES AND SCANNING PROBE MICROSCOPES 2007
  • Jaminskij Dmitrij Igorevich
  • Jaminskij Igor' Vladimirovich
RU2386989C2
PROBE ASSEMBLY FOR SCANNING PROBE MICROSCOPE 2007
  • Khamfris Ehndrju
  • Katto Dehvid
RU2459214C2

RU 2 381 988 C1

Authors

Baturin Andrej Sergeevich

Chuprik Anastasija Aleksandrovna

Dates

2010-02-20Published

2008-10-24Filed