FIELD: scanning probe microscopy.
SUBSTANCE: invention relates to methods of making a conducting coating on the surface of an atomic force microscope for use in electroconductive techniques. Method is realized by depositing nanometer layers of zinc oxide and aluminum oxide in different ratios on the surface of a non-conducting probe, which enables to vary the electrical conductivity of the obtained layer.
EFFECT: obtaining a probe with a conductive coating for an atomic force microscope with the required value of electrical conductivity without changing the radius of the tip.
3 cl, 1 dwg
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Authors
Dates
2024-08-23—Published
2023-11-13—Filed