FIELD: physics.
SUBSTANCE: first and second images are taken without changing the direction of illumination at different distances from the radiation source to the inspected article, after which dimensions of the images of the defect on both images are measured and the depth of the defect is calculated using a certain mathematical expression based on the measurements and known geometry of illumination.
EFFECT: high accuracy of estimating depth of a defect.
1 dwg
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Authors
Dates
2011-12-27—Published
2010-06-04—Filed