FIELD: physics.
SUBSTANCE: method involves projection of a set of images with a given structure of light flux onto the measured surface, recording the set of corresponding images of the surface when viewed at an angle different from the angle of projection of the set of images, and determining the form of the measured surface based on the recorded images. Re-reflecting areas of the measured surface, illumination at the angle of projection of the set of images of which results in ambient illumination of other areas of the measured surface, are determined first. Upon projection of the set of images, the re-reflecting areas darken and the form of the illuminated areas of the surface is determined. Further, by projecting the set of images with given structure of light flux onto previously dark re-reflecting areas, the form of the surface on the re-reflecting areas is determined.
EFFECT: reduced probability of obtaining false or distorted measurement values and wider range of measured surfaces.
3 cl, 8 dwg
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Authors
Dates
2012-04-20—Published
2010-12-29—Filed