FIELD: physics.
SUBSTANCE: two-dimensional presentation of the inspected electronic image is divided into overlapping blocks; k-level wavelet transformation is performed on each block; horizontal, vertical, high-frequency and low-frequency coefficients of the performed wavelet transformation of a block are generated; statistical characteristics of the wavelet transformation coefficients are calculated, from which a vector of statistical characteristics of a block is formed; the vector of statistical characteristics of a block is compared with previously formed vectors of statistical characteristics of knowingly modified electronic images and with previously formed vectors of statistical characteristics of knowingly modified electronic images; a block is identified as modified if the difference between its vector of statistical characteristics and the closest previously formed vector of statistical characteristics of knowingly modified electronic images.
EFFECT: high accuracy of determining coordinates of the modified part of an electronic image.
5 cl, 6 dwg
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